Optical Near-field Electron Microscopy (ONEM): Damage-free, label- free super-resolution imaging of interfaces

Not scheduled
20m
Charles University (Prague)

Charles University

Prague

Ovocný trh 560/5, 110 00 Staré Město, Prague 1
Invited talk

Speaker

Thomas Juffmann (Max Perutz Labs, University of Vienna)

Description

How can we see nanoscale light–matter interactions and fast dynamics at interfaces without damaging fragile samples? In this colloquium, I will introduce Optical Near-field Electron Microscopy (ONEM), a new imaging approach that combines the non-invasiveness of light optics with high spatial resolution enabled by electron optics. The core idea is simple [1]: a specimen is illuminated with light, and the resulting near-field intensity patterns are converted into photoelectrons using a thin photocathode. Those photoelectrons are then imaged with a low-energy electron microscope, providing access to sub-diffraction near-field contrast with minimal invasiveness.

I will explain the underlying theory [1,2] and demonstrate that our prototype achieves a spatial resolution of ~ 30 nm at Hz frame rates [3]. I will then present three illustrative applications: mapping polarization-dependent plasmon modes in nanostructures, live imaging of E. coli in a liquid cell, and real-time visualization of copper electrodeposition. These examples demonstrate ONEM’s unique combination of high spatial resolution, fast temporal response, and compatibility with liquid and electrochemical environments. I will finish by discussing technical challenges, expected improvements, and potential future directions in biology, electrochemistry, and nanophotonics.

References:

[1] R. Marchand et al., Physical Review Applied 16 (1), 014008 (2021)
[2] L. Kienesberger et al., Physical Review Research 6 (2), 23204–23204 (2024)
[3] I. Zykov et al., arxiv (2025)

Author

Thomas Juffmann (Max Perutz Labs, University of Vienna)

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