Speaker
Description
Using an electron microscope to study the optical properties of semiconductors has sparked a lot of research over the years [1], [2] ,[3]. Indeed, despite the complexity of a TEM experiment compared to a full optical one, the increase in spatial resolution, broad excitation, and compatibility with other electron beam-based techniques has been a strong motivation. With the new generation of ultrafast TEM (UTEM), we can now investigate the dynamics of semiconductors within a TEM. Indeed since a few years, time-resolved cathodoluminescence with a UTEM was demonstrated on nanodiamonds [4], [5]. In this presentation, we will demonstrate how we can go further using a UTEM. We will show on GaN-based Nanolaser how we can use photon induced electron microscopy (PINEM) to image the dynamic of stimulated emission during the lasing cycle [6] and combine it to time-resolved cathodoluminescence to draw a full picture of the dynamic of the carriers and lasing properties at the nanoscale.
[1] L. F. Zagonel et al., « Nanometer-scale monitoring of quantum-confined Stark effect and emission efficiency droop in multiple GaN/AlN quantum disks in nanowires », Phys. Rev. B, vol. 93, no 20, p. 205410, mai 2016, doi: 10.1103/PhysRevB.93.205410.
[2] A. Gundimeda, G. Kusch, M. Frentrup, M. J. Kappers, D. J. Wallis, et R. A. Oliver, « Cathodoluminescence studies of the optical properties of a zincblende InGaN/GaN single quantum well », Nanotechnology, vol. 35, no 39, p. 395705, sept. 2024, doi: 10.1088/1361-6528/ad5db4.
[3] L. H. G. Tizei et M. Kociak, « Spatially Resolved Quantum Nano-Optics of Single Photons Using an Electron Microscope », Phys. Rev. Lett., vol. 110, no 15, p. 153604, avr. 2013, doi: 10.1103/PhysRevLett.110.153604.
[4] S. Meuret et al., « Time-resolved cathodoluminescence in an ultrafast transmission electron microscope », Applied Physics Letters, vol. 119, no 6, p. 062106, août 2021, doi: 10.1063/5.0057861.
[5] Y.-J. Kim et O.-H. Kwon, « Cathodoluminescence in Ultrafast Electron Microscopy », ACS Nano, vol. 15, no 12, p. 19480‑19489, déc. 2021, doi: 10.1021/acsnano.1c06260.
[6] C. Santini et al., « Ultrafast near-field imaging of an operating nanolaser using free electrons », 24 mars 2026, arXiv: arXiv:2603.23237. doi: 10.48550/arXiv.2603.23237.