Sub-nanometer Ultrafast Dynamics probed by fast electron beams in (S)TEM

Not scheduled
20m
Charles University (Prague)

Charles University

Prague

Ovocný trh 560/5, 110 00 Staré Město, Prague 1
Poster

Speaker

Yoshie Murooka (The University of Liverpool)

Description

Fast dynamics occurring at the sub-nanometer scale under irradiations have been advanced over 30 years, for example, by introducing a 2D digital detector in STEM [1]. This introduction opened up dynamic observations at high spatial-, momentum-, and energy-resolutions with time resolution [2]. The temporal resolution of electron diffraction and microscopy [3,4,5] has been further boosted by ultrafast laser technology over the past 20 years [3,4,5], while that of a detector has been also improved [6]. Using femtosecond pulsed electron beams, for example, light-induced structural dynamics of nanoparticles [7] and surface structures [8], charge transfer at substrate surfaces [9], light control of magnetic structures [10], and light-matter interactions based on quantum processes [11] have been clarified in both reciprocal space and real space. Recently, observations of beam-sensitive samples, that with a reduced acquisition time, that under low dose conditions have been extensively advanced by developing STEM imaging utilising AI compressed sensing at the University of Liverpool [12]. This technology was also a key feature in the proposed RUEDI project (Relativistic Ultrafast Electron Diffraction and Imaging) [13, 14]. At the poster, I would like to discuss new opportunities in sub-nanometer dynamics in a state-of-art TEM using the IT technology alongside advances in external stimulation techniques, environmental techniques, and electron optics.

References:
[1] D. McMullan, J.M. Rodenburg, Y. Murooka, A.J. McGibbon, Inst. Phys. Conf. Ser. No.98: EMAG-MICRO 89, (1989), p.55-58.
[2] Y. Murooka and J. Yuan, Proc. ICEM 13-PARIS (1994) p.751-752.
[3] B.J. Siwick, et al., Science 302 (2003) 1382.
[4] H. Ihee, et al., Science 291 (2001) 458-462.
[5] T. LaGrange, N.D. Browning et al., Ultramicroscopy 108 (2008) 1441–1449.
[6] T. Weßels, S. Däster, Y. Murooka, B. Zingsem, V. Migunov, M. Kruth, S. Finizio, P-H Lu, A.ás Kovács, A. Oelsner,K. Müller-Caspary, Y. Acremann, R.E. Dunin-Borkowski, Ultramicroscopy 233 (2022) 113392
[7] C.-Y. Ruan, Y. Murooka et al., Nano Letters 7, 1290-1296 (2007).
[8] R.K. Raman, Y. Murooka et al., PRL 101, 077401 (2008).
[9] R. A. Murdick, R. K. Raman, Y. Murooka, and C.-Y. Ruan, Phys. Rev. B 77, 245329 (2008).
[10] G. Berruto, Y. Murooka et al., Phys. Rev. Lett. 120, 117201 (2018).
[11] L. Piazza, Y. Murooka et al., Nature Comm. | 6:6407 | DOI: 10.1038/(2015).
[12] D. Nicholls, N.D. Browning et al., Ultramicroscopy 233 (2022) 113451.
[13] N. D. Browning, et al., Microsc. Microanal. 28 (Suppl 1), (2022), p.2764
[14] Y. Murooka, N.D. Browning et al. Micro. & Micro., 29 (2023) pp. 1487-1488. ISSN 1431-9276.

Author

Yoshie Murooka (The University of Liverpool)

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