Speaker
Description
The spatial-temporal dynamics of photoexcited charge carriers in materials are crucial for a wide range of applications including photovoltaics, photocatalysis, and optoelectronics. To fully resolve the microscopic details of photoexcited carrier dynamics, a combination of high spatial and temporal resolution is required. Scanning ultrafast electron microscopy (SUEM) is a promising photon-pump-electron-probe technique that is highly sensitive to surface photocarrier dynamics with simultaneously high spatial and temporal resolutions. In this talk, I will discuss the recent development of SUEM at UCSB and showcase its capabilities by describing some recent applications of SUEM to image photocarrier dynamics in a variety of technologically relevant materials, including semiconductors, heterojunctions, and Mott insulators. I will also discuss potential future efforts that aim to develop SUEM into an ultrafast platform to explore electron-photon-material interactions.